Napson DUORES手持式電阻率測(cè)試儀

Replaceable hand-held probes for 2 kinds of measurement methods

<1>Non-destructive type(Eddy current method)

<2>Contact type(4point probe method)

?Auto-measurement start by probe head unit put on/probe contact to sample

?Long-battery run time : 24h* (*Battery-operated mode)

?Measurement data display : Max.100 data

?Measurement data save : Max.50,000 data

?Measurement data transfer by USB-Mini

?Measurement unit : Ω/□, S/□,n/m

?Data displayed by 4 digit floating decimal point

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APPLICATIONS

Any sample within the measurement range can be measured. (Films, Glass, Papers etc)

?Thin-film (ITO, TCOetc)

?Low-E-Glass

?CNT(Carbon nanotubes), Graphenmaterials

?Metals (nano-wires, grids, meshes, thin films)

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<***的技術(shù)??

可替換的兩種測(cè)試原理的手持式探頭

(1）渦電流測(cè)試法??

(2)? 四探針探頭

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·探頭觸碰到樣品時(shí)就會(huì)自動(dòng)開(kāi)始測(cè)量

·可以長(zhǎng)達(dá)24小時(shí)的測(cè)量時(shí)間

·最多可以儲(chǔ)存100組數(shù)據(jù)

·可通過(guò)USB-MINI將數(shù)據(jù)導(dǎo)出

·數(shù)據(jù)顯示4位數(shù)的浮動(dòng)小數(shù)點(diǎn)

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·任意樣品只要在測(cè)試范圍內(nèi)都可以進(jìn)行測(cè)量

?? (如薄膜、玻璃、紙張等)

·導(dǎo)電薄膜(ITO、TCO等)

·LOW-E玻璃

·納米碳管、石墨烯材料

·金屬材料(納米銀線、金屬網(wǎng)格、金屬薄膜)

·其他

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樣品尺寸：任意尺寸大小都可以被測(cè)試 (比測(cè)試面積更大的范圍都可以)?