微區(qū)XRF（X射線分析顯微鏡）對(duì)金屬薄膜的快速厚度測(cè)量 Energy dispersive X-ray fluorescence(EDXRF) is an ideal technique for fast and non-destructive elemental characterisation of materials. The XGT-5000 combines this with microscopic spatial resolution, offering unique high intensity x-ray beams with diameters ranging from 1.2mm down to 10um. Accurate quantitative and qualitative analysis are possi ble using single pint analysis, whilst elemental imaging results in detailed distribution maps for specified elements.Furthermore, an additional scintillation detector gives access to transmitted x-ray imaging, revea領(lǐng) inernal structures, even of components embedded in resin. 請(qǐng)發(fā)郵件至info-sci.cn@horiba.com，直接索取更多應(yīng)用案例 X射線熒光分析顯微鏡 X射線熒光分析顯微鏡