Atomic Force Microscopy (AFM) operates by scanning a sharp tip, supported on a sensitive force-sensing cantilever, over the sample and thereby producing a three-dimensional image of the surface. As the tip scans across the samples, changes in the interactions with the surface alter the vertical defl ection of the tip. These changes in defl ection are monitored via an optical detection method. A feedback control system responds to those changes by adjusting the tip-sample distance in order to maintain a constant defl ection. It is this vertical movement of the tip that is used to produce a topographical image of the surface. Both contact mode and TappingMode have demonstrated their high value in life sciences applications, especially during the 5 past years.