VOL. 17 NO. 3 (2005) 24 SPECTROSCOPY EUROPE Whilst there are many imaging techniques available to a research scientist, the information which is provided is often only of a visual/topographical nature. What they fail to provide is true compositional (chemical/elemental) analysis of the materials. However, microspectroscopic techniques such as Raman or X-ray fluorescence (XRF) can fill this gap, allowing highly detailed images to be generated based upon the samples material composition. The information the two techniques provide are quite different, but their application areas are strongly linked. Raman probes chemical bonding within a material using laser radiation, giving information on molecular functional groups, whilst XRF probes elemental composition by analysing fluorescence X-rays emitted following irradiation with a primary X-ray beam. 請(qǐng)發(fā)郵件至info-sci.cn@horiba.com，直接索取更多應(yīng)用案例 X射線熒光分析顯微鏡 X射線熒光分析顯微鏡