国产三级在线看完整版-内射白嫩大屁股在线播放91-欧美精品国产精品综合-国产精品视频网站一区-一二三四在线观看视频韩国-国产不卡国产不卡国产精品不卡-日本岛国一区二区三区四区-成年人免费在线看片网站-熟女少妇一区二区三区四区

儀器網(wǎng)(yiqi.com)歡迎您!

| 注冊(cè)2 登錄
網(wǎng)站首頁(yè)-資訊-話題-產(chǎn)品-評(píng)測(cè)-品牌庫(kù)-供應(yīng)商-展會(huì)-招標(biāo)-采購(gòu)-知識(shí)-技術(shù)-社區(qū)-資料-方案-產(chǎn)品庫(kù)-視頻

應(yīng)用方案

儀器網(wǎng)/ 應(yīng)用方案/ Tip Evaluation Option for NanoScope Atomic Force Mic

立即掃碼咨詢(xún)

聯(lián)系方式:400-822-6768

聯(lián)系我們時(shí)請(qǐng)說(shuō)明在儀器網(wǎng)(www.sdczts.cn)上看到的!

掃    碼    分   享
AFM measurements are limited by the shape of the tip used to probe the sample surface. As the tip wears, the finite size of the AFM tip may not allow the tip to accurately probe narrow or sharp features on a sample, resulting in underestimation of surface roughness and/or rounding/broadening of sharp surface features. For this reason, it is generally desirable to discard a tip when it is no longer sufficiently sharp. This has traditionally been a judgment requiring significant AFM experience.

參與評(píng)論

全部評(píng)論(0條)

推薦方案

在線留言

上傳文檔或圖片,大小不超過(guò)10M
換一張?
取消